A pattern Collection to Support the Practical Challenges Involved in Adopting International Standards for Safety-Related Embedded Systems

Abstract—With the introduction of standards such as ISO 26262, developers of many embedded systems are going through a process of “design migration”, in order to improve system reliability and – thereby – meet certification requirements. Such a migration process can present many challenges for an organization, not least because long- established (and possibly rather informal) working practices can be seen to be under threat. The research presented in this paper investigates the challenges faced by practitioners during the migration process and explores ways in which design patterns can be used to support the transition between informal “event triggered” system architectures and more predictable time-triggered alternatives. The results obtained suggest that migration to time-triggered architecture using a pattern collection may indeed help to follow the latest industry standards and improve system reliability.

Index Terms—Design patterns, event-triggered, migration, reliability, time-triggered.

Nabiha Faisal is with Bahria University Karachi Campus, Pakistan (e-mail: nabiha_faisal@bimcs.edu.pk).

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Cite:Farah Lakhani, Nabiha Faisal, and Michael J. Pont, "A pattern Collection to Support the Practical Challenges Involved in Adopting International Standards for Safety-Related Embedded Systems," Lecture Notes on Software Engineering vol. 4, no. 3, pp. 217-222, 2016.