What's New
  • Dec 26, 2017 News!Vol. 4, No. 1-No.3 has been indexed by EI (Inspec).   [Click]
  • Dec 26, 2017 News!Vol. 3, No. 4 has been indexed by EI (Inspec).   [Click]
  • Dec 25, 2017 News!Welcome to 2018 7th International Conference on Software and Computing Technologies (ICSCT 2018), which will be held in Kuala Lumpur during April 7-9, 2018.   [Click]
General Information
    • ISSN: 2301-3559
    • Frequency: Quarterly
    • DOI: 10.18178/LNSE
    • Editor-in-Chief: Prof. Jemal Antidze
    • Executive Editor: Ms. Nina Lee
    • Abstracting/ Indexing: EI (INSPEC, IET), Electronic Journals Library,  Ulrich's Periodicals Directory, International Computer Science Digital Library (ICSDL), ProQuest and Google Scholar.
    • E-mail: lnse@ejournal.net
Editor-in-chief
Prof. Jemal Antidze
I. Vekua Scientific Institute of Applied Mathematics
Tbilisi State University, Georgia
I'm happy to take on the position of editor in chief of LNSE. We encourage authors to submit papers concerning any branch of Software Engineering.

HOME > Archive > 2013 > Volume 1 Number 2 (May 2013) >
LNSE 2013 Vol.1(2): 160-163 ISSN: 2301-3559
DOI: 10.7763/LNSE.2013.V1.36

An Overview of Technical Models for Dynamic Analysis

Radhika D. Venkatasubramanyam and Snigdha Nayak
Abstract—This paper discusses the Technical Models, collectively referred to as DATM (Dynamic Analysis Technical Models), designed to classify results from dynamic analysis tools. The proposed technical models help structure these findings. Assessment of internal code quality can get simplified by this systematic categorization. DATM is different from the existing models that express internal code quality in terms of the quality attributes. DATM can be used in code reviews using dynamic analysis tools to classify issues from a technical aspect.

Index Terms—Dynamic analysis, technical model, software quality, code review.

R. D. Venkatasubramanyam is with System Development and Test Research Group at Corporate Research & Technologies India, Siemens Technology and Services Private Limited (e-mail: radhika.dv@siemens.com).
S. Nayak is with System Development and Test Research Group at Corporate Research & Technologies India, Siemens Technology and Services Private Limited (e -mail: snigdha.nayak@siemens.com).

[PDF]

Cite: Radhika D. Venkatasubramanyam and Snigdha Nayak, "An Overview of Technical Models for Dynamic Analysis," Lecture Notes on Software Engineering vol. 1, no. 2, pp. 160-163, 2013.

PREVIOUS PAPER
Implementation of CMMI Framework in Small Projects in Small Organizations (An Example of Implementation in Education Domain)
NEXT PAPER
Decision Tree Applied to Learning Relations between Ontologies
Copyright © 2008-2015. Lecture Notes on Software Engineering. All rights reserved.
E-mail: lnse@ejournal.net